In this paper, a method of low power analog testing is proposed. In spite of having Oscillation Based Built in Self-Test methodology (OBIST), a look up table based (LUT) low power testing approach has been proposed to find out the faulty circuit and also to sort out the particular fault location in the circuit. In this paper an operational amplifier, which is the basic building block in the ana...

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Analog-to-digital converters are essential building blocks in modern electronic systems. They form the critical link between front-end analog transducers and back-end digital computers that can efficiently implement a wide variety of signal-processing functions. The wide variety of digitalsignal-processing applications leads to the availability of a wide variety of analog-to-digital (A/D) conve...

SUMMARY An analog circuit testing scheme is presented. The testing technique is a sinusoidal fault signature characterization, involving the measurement of DC offset, amplitude, frequency and phase shift, and the realization of two crossing level voltages. The testing system is an extension of the IEEE 1149.4 standard through the modification of an analog boundary module, affording functionalit...

−A new approach based on the 4D method [1,2] is proposed to self-testing of analog networks (circuits) of mixed analog-digital microsystems controlled by microcontrollers. It is characterised by simplicity and facility of the implementation of diagnosis algorithms in simple and popular microcontrollers. In the paper the creation of a fault dictionary and self-testing procedures of analog networ...

Functional macro testing of analog subsystems is providing a reasonable approach to testing in mixed signal systems. This allows the partitioning of the analog from digital components. Two approaches emerge: analog test bus and Built-In-Self-Test (BIST). Design-for-Test (DFT) issues arise in both approaches which include additional circuitry for control and observation. This additional circuit ...